Efficient Data Averaging for Spin Noise Spectroscopy in Semiconductors

TL;DR

This paper demonstrates that ultrafast low-bit-depth digitizers, when properly optimized, can significantly improve the sensitivity and bandwidth of spin noise spectroscopy in semiconductors, even under high optical noise conditions.

Contribution

It introduces a simulation-based analysis showing how optimized input load and low bit depth digitizers enhance SNS measurements in semiconductors.

Findings

Low bit depth digitizers enable high bandwidth SNS.

Optimized input load is crucial for sensitivity.

Bit depth has a weak influence on sensitivity.

Abstract

Spin noise spectroscopy (SNS) is the perfect tool to investigate electron spin dynamics in semiconductors at thermal equilibrium. We simulate SNS measurements and show that ultrafast digitizers with low bit depth enable sensitive, high bandwidth SNS in the presence of strong optical background shot noise. The simulations reveal that optimized input load at the digitizer is crucial for efficient spin noise detection while the bit depth influences the sensitivity rather weakly.