Polarization-analyzed resonant inelastic x-ray scattering of the orbital excitations in KCuF3

TL;DR

This study uses polarization-resolved resonant inelastic x-ray scattering to analyze orbital excitations in KCuF3, revealing their polarization dependence and dispersionless nature, advancing understanding of orbital dynamics in correlated materials.

Contribution

It introduces polarization analysis in RIXS for orbital excitations, providing new insights into their symmetry and dispersion properties in KCuF3.

Findings

Orbital excitations show distinct polarization dependence.

Orbital excitations are dispersionless within experimental resolution.

Polarization analysis helps interpret symmetry of RIXS processes.

Abstract

We report a Cu K-edge resonant inelastic x-ray scattering (RIXS) study of orbital excitations in KCuF3 . By performing the polarization analysis of the scattered photons, we disclose that the excitation between the eg orbitals and the excitations from t2g to eg exhibit distinct polarization dependence. The polarization dependence of the respective excitations is interpreted based on a phenomenological consideration of the symmetry of the RIXS process that yields a necessary condition for observing the excitations. In addition, we show that the orbital excitations are dispersionless within our experimental resolution.