Reflectance measurement of two-dimensional photonic crystal nanocavities with embedded quantum dots

TL;DR

This study compares photoluminescence and reflectance spectroscopy for measuring resonant wavelengths and Q-factors of 2D photonic crystal nanocavities with embedded quantum dots, demonstrating the effectiveness of reflectance methods.

Contribution

It introduces a reflectance measurement technique for nanocavities that can assess both active and passive structures, supported by experimental data and analytical modeling.

Findings

Reflectance method accurately measures resonant wavelengths and Q-factors.

Q-factors decrease with increasing wavelength, especially beyond 1370 nm.

Analytical model reproduces wavelength dependence of reflected intensity.

Abstract

The spectra of two-dimensional photonic crystal slab nanocavities with embedded InAs quantum dots are measured by photoluminescence and reflectance. In comparing the spectra taken by these two different methods, consistency with the nanocavities' resonant wavelengths is found. Furthermore, it is shown that the reflectance method can measure both active and passive cavities. Q-factors of nanocavities, whose resonant wavelengths range from 1280 to 1620 nm, are measured by the reflectance method in cross polarization. Experimentally, Q-factors decrease for longer wavelengths and the intensity, reflected by the nanocavities on resonance, becomes minimal around 1370 nm. The trend of the Q-factors is explained by the change of the slab thickness relative to the resonant wavelength, showing a good agreement between theory and experiment. The trend of reflected intensity by the nanocavities on resonance can be understood as effects that originate from the PC slab and the underlying air cladding thickness. In addition to three dimensional finite-difference time-domain calculations, an analytical model is introduced that is able to reproduce the wavelength dependence of the reflected intensity observed in the experiment.