Determination of Edge Purity in Bilayer Graphene Using micro-Raman Spectroscopy

TL;DR

This study uses polarization-resolved micro-Raman spectroscopy to analyze edge purity in bilayer graphene, revealing polarization dependence that correlates with edge structure and can monitor edge composition for nanoelectronic applications.

Contribution

It demonstrates that polarization contrast in Raman spectra can quantify the fractional composition of armchair and zigzag edges in bilayer graphene.

Findings

G band intensity varies with laser polarization

Polarization dependence matches theoretical predictions

Edge purity can be monitored via polarization contrast

Abstract

Polarization resolved micro-Raman spectroscopy was carried out at the edges of bilayer graphene. We find strong dependence of the intensity of the G band on the incident laser polarization, with its intensity dependence being 90 degrees out of phase for the armchair and zigzag case, in accordance with theoretical predictions. For the case of mixed-state edges we demonstrate that the polarization contrast reflects the fractional composition of armchair and zigzag edges, providing a monitor of edge purity, which is an important parameter for the development of efficient nanoelectronic devices.