Stabilizing the forming process in unipolar resistance switching using an improved compliance current limiter
S. B. Lee, S. H. Chang, H. K. Yoo, and B. S. Kang

TL;DR
This paper introduces an improved compliance current limiter that stabilizes the forming process in unipolar resistance switching, effectively reducing high reset currents and enhancing device reliability.
Contribution
The paper presents a novel, simple Icomp-limiter that precisely controls current overflow during forming, improving stability and reliability in unipolar resistance memory devices.
Findings
Significant reduction in reset current IR after forming
Enhanced stability of unipolar resistance switching
Improved reliability of memory device operation
Abstract
The high reset current IR in unipolar resistance switching now poses major obstacles to practical applications in memory devices. In particular, the first IR-value after the forming process is so high that the capacitors sometimes do not exhibit reliable unipolar resistance switching. We found that the compliance current Icomp is a critical parameter for reducing IR-values. We therefore introduced an improved, simple, easy to use Icomp-limiter that stabilizes the forming process by drastically decreasing current overflow, in order to precisely control the Icomp- and subsequent IR-values.
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