RASOR: An advanced instrument for soft x-ray reflectivity and diffraction

TL;DR

The paper introduces RASOR, a versatile soft x-ray diffractometer designed for studying single crystal diffraction and thin film reflectivity, featuring advanced motorized controls, polarization analysis, and cryogenic capabilities.

Contribution

It presents the design and initial testing of a novel soft x-ray diffractometer with unique features for enhanced material analysis.

Findings

Successful initial tests demonstrate instrument functionality.

Precise sample positioning capabilities confirmed.

Potential for advanced diffraction and reflectivity studies.

Abstract

We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle ({\theta}, 2{\theta}, {\chi}) diffractometer with an additional removable rotation ({\phi}) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorised motions are provided for the precise positioning of the sample onto the diffractometer centre of rotation, and for positioning the centre of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument.