Relation between chemical force and tunneling current in point contacts: a simple model

TL;DR

This paper proposes a simple model to better understand the relationship between tunneling current and chemical force during atomic contact formation in scanning probe microscopy.

Contribution

It introduces a straightforward model that offers new insights into the interplay between tunneling current and chemical force in atomic contacts.

Findings

Model clarifies the relation between tunneling current and chemical force.

Provides quantitative predictions for atomic contact formation.

Enhances understanding of atomic-scale interactions in SPM.

Abstract

Aim of this paper is to find out a simple model, which provides more insight into the relation between the tunneling current and the chemical force arising during formation of atomic contact in between a SPM probe and surface atom.