Large capacitance enhancement and negative compressibility of two-dimensional electronic systems at LaAlO$_3$/SrTiO$_3$ interfaces
Lu Li, C. Richter, S. Paetel, T. Kopp, J. Mannhart, R. C. Ashoori

TL;DR
This study demonstrates large capacitance enhancement and negative electronic compressibility at LaAlO₃/SrTiO₃ interfaces, revealing tunable electron densities and overscreening effects crucial for oxide electronic device applications.
Contribution
It introduces a method to control and deplete the interface electron system using top gates and reports the first observation of negative compressibility at this oxide interface.
Findings
Capacitance exceeds geometric limits at low densities
Complete depletion of the metallic interface with small voltages
Evidence of overscreening and negative compressibility
Abstract
Novel electronic systems forming at oxide interfaces comprise a class of new materials with a wide array of potential applications. A high mobility electron system forms at the LaAlO/SrTiO interface and, strikingly, both superconducts and displays indications of hysteretic magnetoresistance. An essential step for device applications is establishing the ability to vary the electronic conductivity of the electron system by means of a gate. We have fabricated metallic top gates above a conductive interface to vary the electron density at the interface. By monitoring capacitance and electric field penetration, we are able to tune the charge carrier density and establish that we can completely deplete the metallic interface with small voltages. Moreover, at low carrier densities, the capacitance is significantly enhanced beyond the geometric capacitance for the structure. In the same…
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