Dramatic Mobility Enhancements in Doped SrTiO3 Thin Films by Defect Management
Y. Kozuka, Y. Hikita, C. Bell, and H. Y. Hwang

TL;DR
This paper demonstrates that precise defect management in doped SrTiO3 thin films significantly enhances electron mobility, achieving record-high values through controlled defect chemistry during fabrication.
Contribution
It introduces a defect management strategy in pulsed laser deposition to produce high-mobility SrTiO3 films with bulk-quality properties.
Findings
Electron mobility up to 6600 cm2 V-1 s-1 at 2 K
Carrier density as low as 2.0 x 10^18 cm^-3
Defect chemistry control improves film quality
Abstract
We report bulk-quality n-type SrTiO3 (n-SrTiO3) thin films fabricated by pulsed laser deposition, with electron mobility as high as 6600 cm2 V-1 s-1 at 2 K and carrier density as low as 2.0 x 10^18cm-3 (~ 0.02 at. %), far exceeding previous pulsed laser deposition films. This result stems from precise strontium and oxygen vacancy defect chemistry management, providing a general approach for defect control in complex oxide heteroepitaxy.
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