A digital oscilloscope setup for the measurement of a transistor's characteristics

TL;DR

This paper presents a digital oscilloscope-based setup for measuring transistor characteristics, enabling students to perform accurate measurements without extra circuitry, using open-source software for analysis.

Contribution

It introduces a simple, cost-effective method for transistor characterization using a digital oscilloscope and open-source tools, suitable for educational settings.

Findings

Effective measurement of transistor curves without custom circuitry

Open-source software facilitates data analysis

Accessible setup for electronics education

Abstract

The measure of the characteristics of a transistor is an important step in an introductory electronics course. We propose to use a digital oscilloscope with a USB connection to perform a measurement of the characteristic curves with no additional custom circuitry. The setup is presented alongside with code that allows the importation and analysis of the results with open-source software.