Phonon Raman scattering of perovskite LaNiO3 thin films
N. Chaban, M. Weber, S. Pignard, J. Kreisel
TL;DR
This study uses Raman scattering to analyze the phonon modes of LaNiO3 thin films, revealing temperature-induced structural changes and providing reference data for future structural investigations.
Contribution
It offers new Raman spectra data for LaNiO3 thin films and insights into temperature-dependent structural evolution, aiding future research on strain effects.
Findings
Raman spectra provide reference data for LaNiO3
Temperature causes softening of A1g mode
Structural distortion decreases with temperature
Abstract
We report an investigation of perovskite-type LaNiO3 thin films by Raman scattering in both various scattering configurations and as a function of temperature. The room-temperature Raman spectra and the associated phonon mode assignment provide reference data for phonon calculations and for the use of Raman scattering for structural investigations of LaNiO3, namely the effect of strain in thin films or heterostructures. The temperature-dependent Raman spectra from 80 to 900 K are characterized by the softening of the rotational A1g mode, which suggest a decreasing rhombohedral distortion towards the ideal cubic structure with increasing temperature.
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