Effects of Parasitics and Interface Traps On Ballistic Nanowire FET In The Ultimate Quantum Capacitance Limit
Kausik Majumdar, Navakanta Bhat, Prashant Majhi, Raj Jammy

TL;DR
This paper investigates how parasitics and interface traps affect the performance of ballistic nanowire FETs in the Ultimate Quantum Capacitance Limit, revealing improved saturation and scaling properties but sensitivity to interface effects.
Contribution
It provides a detailed analysis of quantum capacitance effects on nanowire FETs, introducing semi-analytical models and comparing UQCL with classical limits under various parasitic conditions.
Findings
UQCL shows non-monotonic multi-peak C-V characteristics due to subband quantization.
Ballistic drain current saturates better in UQCL than in CCL.
Subthreshold slope remains unaffected in UQCL despite interface traps and parasitics.
Abstract
In this paper, we focus on the performance of a nanowire Field Effect Transistor (FET) in the Ultimate Quantum Capacitance Limit (UQCL) (where only one subband is occupied) in the presence of interface traps (), parasitic capacitance () and source/drain series resistance () using a ballistic transport model and compare the performance with its Classical Capacitance Limit (CCL) counterpart. We discuss four different aspects relevant to the present scenario, namely, (i) gate voltage dependent capacitance, (ii) saturation of the drain current, (iii) the subthreshold slope and (iv) the scaling performance. To gain physical insights into these effects, we also develop a set of semi-analytical equations. The key observations are: (1) A strongly energy-quantized nanowire shows non-monotonic multiple peak C-V characteristics due to discrete contributions from individual…
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