Wavelet and R/S analysis of the X-ray flickering of cataclysmic variables
G. Anzolin, F. Tamburini, D. de Martino, A. Bianchini

TL;DR
This study analyzes the statistical properties of X-ray flickering in cataclysmic variables using wavelet and R/S analysis, revealing persistent stochastic behavior and linking flickering characteristics to physical parameters.
Contribution
It provides the first comprehensive statistical analysis of X-ray flickering in cataclysmic variables, connecting flickering properties with physical parameters and magnetic features.
Findings
X-ray flickering shows long timescale events with alpha between 1.5 and 3.
Hurst exponents are generally above 0.5, peaking at 0.82, indicating persistent memory.
X-ray flickering is similar across different classes and exhibits stronger persistence in magnetic systems.
Abstract
Recently, wavelets and R/S analysis have been used as statistical tools to characterize the optical flickering of cataclysmic variables. Here we present the first comprehensive study of the statistical properties of X-ray flickering of cataclysmic variables in order to link them with physical parameters. We analyzed a sample of 97 X-ray light curves of 75 objects of all classes observed with the XMM-Newton space telescope. By using the wavelets analysis, each light curve has been characterized by two parameters, alpha and Sigma, that describe the energy distribution of flickering on different timescales and the strength at a given timescale, respectively. We also used the R/S analysis to determine the Hurst exponent of each light curve and define their degree of stochastic memory in time. The X-ray flickering is typically composed of long time scale events (1.5 < alpha < 3), with very…
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