System size scaling of topological defect creation in a second-order dynamical quantum phase transition
Michael Uhlmann, Ralf Sch\"utzhold, Uwe R. Fischer

TL;DR
This paper studies how the number of topological defects created during a second-order quantum phase transition scales with system size, revealing surface-area and dimension-dependent behaviors.
Contribution
It introduces a mean-field approach to analyze defect scaling in large N systems, highlighting the impact of symmetries and correlations on defect variance.
Findings
Defect variance scales with surface area in short-range correlated systems.
In systems with broken isotropy and long-range correlations, scaling depends on the dimension being even or odd.
For even dimensions, defect variance scales with surface area squared, with oscillations; for odd, it vanishes.
Abstract
We investigate the system size scaling of the net defect number created by a rapid quench in a second-order quantum phase transition from an O(N) symmetric state to a phase of broken symmetry. Using a controlled mean-field expansion for large N, we find that the net defect number variance in convex volumina scales like the surface area of the sample for short-range correlations. This behaviour follows generally from spatial and internal symmetries. Conversely, if spatial isotropy is broken, e.g., by a lattice, and in addition long-range periodic correlations develop in the broken-symmetry phase, we get the rather counterintuitive result that the scaling strongly depends on the dimension being even or odd: For even dimensions, the net defect number variance scales like the surface area squared, with a prefactor oscillating with the system size, while for odd dimensions, it essentially…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
