Visualizing Three-Dimensional Micromechanical Response in Nanomaterials

TL;DR

This paper introduces a diffraction-based visualization method called the diffraction strain ellipsoid, enabling rapid and intuitive analysis of three-dimensional micromechanical deformation in nanomaterials.

Contribution

It presents the concept of the diffraction strain ellipsoid and demonstrates how to quickly determine its geometry from x-ray diffraction data for nanomaterials.

Findings

Diffraction strain ellipsoid effectively visualizes deformation.

Method allows rapid analysis from large area detector data.

Provides insights into micromechanical deformation mechanisms.

Abstract

Understanding mechanical properties of materials requires not only complete determination of the three-dimensional response at a local scale, but also knowledge of the mode or the mechanism by which deformation takes place. Probing mechanical response at such a depth can be only achieved through a diffraction based method. In spite of this, diffraction based methods still are not commonly employed for strain measurements because they are perceived as very time intensive and non-intuitive. Herein we introduce the concept of a diffraction strain ellipsoid, and show how its shape, thickness, and orientation represent the complete deformation state in a powerfully visual and intuitive way. We also show how the geometry of the ellipsoid can be very quickly determined from x-ray diffraction data obtained using a large area detector, and how it can be used to understand micromechanical deformation of nanocrystalline materials.