Roughness with a finite correlation length in the Microtrap

TL;DR

This paper investigates how geometric roughness with finite correlation length affects magnetic trapping potentials in microtraps, using theoretical modeling and experimental data to improve understanding of atom trap fluctuations.

Contribution

It introduces a model considering colored noise with finite correlation length to explain magnetic field roughness effects in microtraps, validated by experimental comparisons.

Findings

The relation between potential fluctuation and trap height matches experimental data.

Generated random potentials produce BEC density distributions consistent with observed fragmentation.

The study enhances understanding of fluctuation origins and potential for precise measurements.

Abstract

We analyze the effects of roughness in the magnitude of the magnetic field produced by a current carrying microwire, which is caused by geometric fluctuation of the edge of wire. The relation between the fluctuation of the trapping potential and the height that atom trap lies above the wire is consistent with the experimental data very well, when the colored noise with a finite correlation length is considered. On this basis, we generate the random potential and get the density distribution of the BEC atoms by solving the Gross-Pitaevskii equation, which coincides well with the experimental image, especially in the number of fragmentations. The results help us further understand the nature of the fluctuation and predict the possible application in the precise measurement.