Penetration depth of electron-doped-infinite-layer Sr$_{0.88}$La$_{0.12}$CuO$_{2+x}$ thin films
L. Fruchter, V. Jovanovic, H. Raffy, Sid Labdi, F. Bouquet, Z.Z. Li

TL;DR
This study measures the in-plane penetration depth of Sr$_{0.88}$La$_{0.12}$CuO$_{2+x}$ thin films, revealing deviations from s-wave behavior and indicating the influence of disorder and complex gap structures in electron-doped cuprates.
Contribution
It provides new insights into the superfluid density and gap symmetry of electron-doped infinite-layer cuprates through AC susceptibility measurements.
Findings
Superfluid density deviates from s-wave behavior at higher doping.
Evidence of a nodal hole pocket or anisotropic s-wave gap.
Superconducting transition occurs in the phase-fluctuation regime.
Abstract
The in-plane penetration depth of SrLaCuO thin films at various doping obtained from oxygen reduction has been measured, using AC susceptibility measurements. For the higher doping samples, the superfluid density deviates strongly from the s-wave behavior, suggesting, in analogy with other electron-doped cuprates, a contribution from a nodal hole pocket, or a small gap on the Fermi surface such as an anisotropic s-wave order parameter. The low value of the superfluid densities, likely due to a strong doping-induced disorder, places the superconducting transition of our samples in the phase-fluctuation regime.
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