Diffraction of thermal radiation from binary anisotropic structure
Nir Dahan, Yuri Gorodetski, Kobi Frischwasser, Vladimir Kleiner and, Erez Hasman
TL;DR
This paper analyzes the diffraction of thermal radiation from a binary anisotropic structure composed of SiC gratings, focusing on how the structure's symmetry influences the emitted light's dispersion relation.
Contribution
It introduces a detailed analysis of thermal emission diffraction from binary anisotropic gratings supported by phonon-polaritons, highlighting the role of domain orientation.
Findings
Dispersion relation aligns with the structure's translation symmetry.
Orientation of homogeneous grating domains affects thermal emission.
Binary anisotropic structure modifies thermal radiation patterns.
Abstract
Thermal emission from binary grating on SiC wafer supported by phonon-polaritons is analyzed. The structure is comprised of homogeneous grating domains, whose orientation is parallel and perpendicular to the x-axis. The dispersion relation of the emitted light corresponds to translation symmetry of the structure.
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Taxonomy
TopicsThermal Radiation and Cooling Technologies · Silicon Nanostructures and Photoluminescence · Near-Field Optical Microscopy