Criticality in Trapped Atomic Systems

TL;DR

This paper examines how trapping potentials affect the measurement of critical parameters in atomic systems, proposing optimal methods for accurate determination despite experimental limitations.

Contribution

It demonstrates that proper analysis of time-of-flight images can accurately extract critical parameters, challenging recent claims and addressing trap-induced limitations.

Findings

In-situ density profiles are inadequate for critical point analysis in strongly correlated regimes.

Time-of-flight image analysis yields accurate critical parameters.

Current experimental conditions limit the usefulness of in-situ density profiles.

Abstract

We discuss generic limits posed by the trap in atomic systems on the accurate determination of critical parameters for second-order phase transitions, from which we deduce optimal protocols to extract them. We show that under current experimental conditions the in-situ density profiles are barely suitable for an accurate study of critical points in the strongly correlated regime. Contrary to recent claims, the proper analysis of time-of-fight images yields critical parameters accurately.