Extensive testing of Schottky CdTe detectors for the ECLAIRs X-Gamma-ray Camera on board the SVOM mission
Remoue Nadege (CESR Toulouse), Barret Didier (CESR Toulouse), Godet, Olivier (CESR Toulouse), Mandrou Pierre (CESR Toulouse)

TL;DR
This paper reports extensive testing of over 5000 Schottky CdTe detectors for the ECLAIRs X-Gamma-ray Camera on the SVOM mission, focusing on their performance, stability, and suitability for space deployment.
Contribution
It provides a comprehensive evaluation of detector quality, stability, and polarization effects, identifying the subset suitable for flight use and analyzing their physical properties.
Findings
78% of tested detectors are suitable for flight
Mean energy resolution of 1.8 keV at 59.6 keV
Detectors remain stable over more than a day under in-flight conditions
Abstract
We report on an on-going test campaign of more than 5000 Schottky CdTe detectors (4x4x1 mm^3), over a sample of twelve thousands, provided by Acrorad Co., Ltd (Japan). 6400 of these detectors will be used to build the detection plane of the ECLAIRs camera on the Chinese-French gamma-ray burst mission SVOM. These tests are mandatory to fulfill the prime requirement of ECLAIRs to detect gamma-ray burst photons down to 4 keV. The detectors will be operated at -20C under a reverse bias of 600 V. We found that 78% of the detectors already tested could be considered for the flight model. We measured a mean energy resolution of 1.8 keV at 59.6 keV. We investigated the polarization effect first at room temperature and low bias voltage for faster analysis. We found that the spectroscopic degradation in quantum efficiency, gain and energy resolution, starts as soon as the bias is turned on: first…
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Taxonomy
TopicsAdvanced X-ray and CT Imaging · Advanced Semiconductor Detectors and Materials · Nuclear Physics and Applications
