Accurate measurement of the cutoff wavelength in a microstructured optical fiber by means of an azimutal filtering technique

TL;DR

This paper introduces a simple, non-destructive, self-referenced method using azimuthal filtering to accurately measure the cutoff wavelength of microstructured optical fibers, achieving 10nm precision.

Contribution

The paper presents a novel azimuthal filtering technique for precise, non-destructive cutoff wavelength measurement in microstructured optical fibers.

Findings

Measured cutoff wavelength with 10nm precision

Results agree well with theoretical predictions

Method is simple and self-referenced

Abstract

A simple self-referenced non destructive method is proposed for measuring the cutoff wavelength of microstructured optical fibers (MOFs). It is based on the analysis of the time dependent optical power transmitted through a bow-tie slit rotating in the far-field pattern of the fiber under test. As a first demonstration, the cutoff wavelength of a 2m MOF sample is measured with a precision of 10nm, in good agreement with theoretical predictions.