Resonant escape over an oscillating barrier in single-electron ratchet transfer

TL;DR

This paper experimentally investigates how single electrons escape over an oscillating barrier in a silicon ratchet, revealing synchronization effects and a resonant activation phenomenon characterized by a minimum in escape time.

Contribution

It demonstrates the first experimental observation of resonant activation in single-electron escape over an oscillating barrier in silicon-based ratchets.

Findings

Escape time shows a minimum at a specific oscillation frequency.

Synchronization between barrier modulation and escape events occurs.

Resonant activation signature observed in single-electron transfer.

Abstract

Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.