How to erase surface plasmon fringes
Aurelien Drezet, Andrey L. Stepanov, Andreas Hohenau, Harald, Ditlbacher, Bernhard Steinberger, Nicole Galler, Franz R. Aussenegg, Alfred, Leitner, Joachim R. Krenn
TL;DR
This paper introduces a dual SPP microscope utilizing leakage radiation analysis to image and manipulate surface plasmon polaritons in both real and Fourier space, enabling clearer separation of interference effects near nanoelements.
Contribution
The work presents a novel dual SPP microscope that combines real and Fourier space imaging for enhanced analysis of surface plasmons.
Findings
Successful implementation of a dual SPP microscope.
Ability to separate interfering SPP contributions.
Enhanced imaging of nanoelement interactions.
Abstract
We report the realization of a dual surface plasmon polariton (SPP) microscope based on leakage radiation (LR) analysis. The microscope can either image SPP propagation in the direct space or tin the Fourier space. This particularity allows in turn manipulation of the LR image for a clear separation of different interfering SPP contributions present close to optical nanoelements.
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