Dynamical behavior of damped driven coupled single electron simple harmonic oscillators
M. Ziaur Rahman Khan, D. G. Hasko, M. S. M. Saifullah, M. E., Welland

TL;DR
This study investigates the dynamical behavior of trapped electrons in a silicon MOSFET using microwave spectroscopy, modeling their interactions as coupled damped harmonic oscillators, with implications for quantum information processing.
Contribution
It demonstrates that trap dynamics can be described by a classical harmonic oscillator model and shows potential for multi-qubit quantum circuits within a single transistor.
Findings
Over 1000 traps can be individually addressed.
Trap interactions modulate the drain current.
The model enables extraction of coherence and coupling parameters.
Abstract
Coherent coupling between a large number of qubits is the goal for scalable approaches to solid state quantum information processing. Prototype systems can be characterized by spectroscopic techniques. Here, we use pulsed-continuous wave microwave spectroscopy to study the behavior of electrons trapped at defects within the gate dielectric of a sol-gel-based high-k silicon MOSFET. Disorder leads to a wide distribution in trap properties, allowing more than 1000 traps to be individually addressed in a single transistor within the accessible frequency domain. Their dynamical behavior is explored by pulsing the microwave excitation over a range of times comparable to the phase coherence time and the lifetime of the electron in the trap. Trap occupancy is limited to a single electron, which can be manipulated by resonant microwave excitation and the resulting change in trap occupancy is…
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Taxonomy
TopicsSemiconductor materials and devices · Quantum and electron transport phenomena · Semiconductor Quantum Structures and Devices
