Thin film dielectric microstrip kinetic inductance detectors

TL;DR

This paper introduces a novel microstrip transmission line resonator MKID, providing the first theoretical and experimental analysis of its dielectric loss and noise characteristics, achieving high quality factors and low noise equivalent power.

Contribution

It presents the first theory and measurements of a microstrip MKID, demonstrating high quality factors and competitive noise performance.

Findings

Achieved a noise equivalent power of 5×10^{-17} W/Hz^{1/2} at 1 Hz

Demonstrated the highest quality factors in a microstrip dielectric resonator

Validated the theory with experimental measurements

Abstract

Microwave Kinetic Inductance Detectors, or MKIDs, are a type of low temperature detector that exhibit intrinsic frequency domain multiplexing at microwave frequencies. We present the first theory and measurements on a MKID based on a microstrip transmission line resonator. A complete characterization of the dielectric loss and noise properties of these resonators is performed, and agrees well with the derived theory. A competitive noise equivalent power of 5$\times10^{-17}$ W Hz$^{-1/2}$ at 1 Hz has been demonstrated. The resonators exhibit the highest quality factors known in a microstrip resonator with a deposited thin film dielectric.