On the characterization of a random monolayer of particles from coherent optical reflectance

TL;DR

This paper demonstrates that optical coherent reflectance measurements around the critical angle can effectively determine particle size and surface coverage in a monolayer of polystyrene particles on glass, especially for larger particles.

Contribution

It introduces a method to extract particle size and surface coverage from reflectance data using a CSM fit in an internal reflection setup.

Findings

Accurate particle size estimation for sufficiently large particles.

Surface coverage can be inferred from reflectance data.

Method is viable for polystyrene particles on glass surfaces.

Abstract

We present the viability of obtaining the particle size and surface coverage in a monolayer of polystyrene particles adsorbed on a glass surface from optical coherent reflectance data around the critical angle in an internal reflection configuration. We have found that fitting a CSM to optical reflectivity curves in an internal reflection configuration around the critical angle with a dilute random monolayer of particles adsorbed on the surface can in fact provide the particle's radius and surface coverage once the particles are sufficiently large.