Microchannel avalanche photodiode with wide linearity range
Z. Sadygov, A. Olshevski, N. Anphimov, T. Bokova, V. Chalyshev, I., Chirikov-Zorin, A. Dovlatov, Z. Krumshtein, R. Mekhtieva, R. Mukhtarov, V., Shukurova, M. Troitskaya, V. Zhezher

TL;DR
This paper introduces a novel microchannel avalanche photodiode with enhanced linearity and pixel density, utilizing a unique directly biased p-n junction for improved performance and sensitivity.
Contribution
The paper presents a new MC APD design with a directly biased p-n junction, achieving higher linearity and pixel density compared to existing devices.
Findings
Gain up to 10^5 achieved
Linearity range improved by an order of magnitude
Pixel density increased to 40000 per mm^2
Abstract
Design and physical operation principles of new microchannel avalanche photodiode (MC APD) with gain up to 10^5 and linearity range improved an order of magnitude compared to known similar devices. A distinctive feature of the new device is a directly biased p-n junction under each pixel which plays role of an individual quenching resistor. This allows increasing pixel density up to 40000 per mm^2 and making entire device area sensitive.
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