Radiation hardness of CMS pixel barrel modules
T. Rohe, A. Bean, W. Erdmann, H.-C. Kaestli, S. Khalatyan, B. Meier,, V. Radicci, J. Sibille

TL;DR
This study evaluates the radiation tolerance of CMS pixel modules, establishing a benchmark for their operation longevity under high fluences expected in future LHC upgrades.
Contribution
It provides empirical data on the radiation hardness of CMS pixel modules up to unprecedented fluences, informing future detector design and upgrade strategies.
Findings
Modules remain operational up to 2.8E15 Neq fluence
Charge collection efficiency persists after irradiation at high fluences
Further testing needed for stable high-efficiency operation at extreme fluences
Abstract
Pixel detectors are used in the innermost part of the multi purpose experiments at LHC and are therefore exposed to the highest fluences of ionising radiation, which in this part of the detectors consists mainly of charged pions. The radiation hardness of all detector components has thoroughly been tested up to the fluences expected at the LHC. In case of an LHC upgrade, the fluence will be much higher and it is not yet clear how long the present pixel modules will stay operative in such a harsh environment. The aim of this study was to establish such a limit as a benchmark for other possible detector concepts considered for the upgrade. As the sensors and the readout chip are the parts most sensitive to radiation damage, samples consisting of a small pixel sensor bump-bonded to a CMS-readout chip (PSI46V2.1) have been irradiated with positive 200 MeV pions at PSI up to 6E14 Neq and…
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