A way to measure electron spin-flipping at F/N interfaces and application to Co/Cu

TL;DR

This paper introduces a CPP magnetoresistance measurement technique to quantify electron spin-flipping at F/N interfaces, specifically applied to Co/Cu, providing consistent results with previous estimates.

Contribution

The paper presents a novel CPP-based method to measure the spin-flip parameter at F/N interfaces, validated on Co/Cu, with no adjustable parameters.

Findings

Measured delta(Co/Cu) consistent with prior values

Technique accurately detects spin-flip at F/N interfaces

Results support the validity of the measurement method

Abstract

We describe a technique, using the current-perpendicular-to-plane (CPP) geometry, to measure the parameter delta(F/N), characterizing flipping of electron spins at a ferromagnetic/non-magnetic (F/N) metallic interface. The technique involves measuring the CPP magnetoresistance of a sample containing a ferromagnetically coupled [F/N]x n multilayer embedded within the 20 nm thick central Cu layer of a symmetric Py-based, double exchange-biased spin-valve. To focus on delta(F/N), the F- and N-layers are made thin compared to their spin-diffusion lengths. We test the technique using F/N = Co/Cu. Analysing with no adjustable parameters, gives inconsistency with delta(Co/Cu) = 0, but consistency with our prior value of delta(Co/Cu) = 0.25 (+/- 0.1). Taking delta(Co/Cu) as adjustable gives delta(Co/Cu) = 0.33 (+0.03/-0.08).