Sub-nanoscale Resolution for Atom Localization, Lithography and Microscopy via Coherent Population Trapping

TL;DR

This paper introduces a coherent population trapping technique that achieves sub-nanometer resolution for atom localization, microscopy, and lithography by exploiting steep dispersion in three-level atoms with amplitude-modulated probe fields.

Contribution

The paper presents a novel optical scheme using three-level atoms and amplitude modulation to reach sub-nanoscale resolution, advancing precision in microscopy and lithography.

Findings

Achieves sub-nanometer resolution using optical fields.

Demonstrates application to microscopy and lithography.

Shows potential for further resolution improvement with multilevel schemes.

Abstract

We present a coherent population trapping based scheme to attain sub-nanoscale resolution for atom localization, microscopy and lithography. Our method uses three-level atoms coupled to amplitude modulated probe field and spatially dependent drive field. The modulation of the probe field allows us to tap into the steep dispersion normally associated with electromagnetically induced transparency and offers an avenue to attain sub-nanometer resolution using just optical fields. We illustrate application of the techniques to the area of microscopy and lithography and show how multilevel schemes offer the possibility of improving resolution further.