Single-Electron Tunneling and the Fluctuation Theorem
Y. Utsumi, D. S. Golubev, M. Marthaler, T. Fujisawa, Gerd Sch\"on

TL;DR
This paper investigates single-electron tunneling in a double quantum dot system, testing the Fluctuation Theorem through full-counting statistics, and analyzes environmental fluctuations and detector bandwidth effects on the measurements.
Contribution
It provides a quantitative explanation of how environmental fluctuations and detector bandwidth influence the Fluctuation Theorem in single-electron tunneling experiments.
Findings
Environmental fluctuations enhance the effective temperature in the FT.
Finite detector bandwidth affects the accuracy of tunneling measurements.
The study offers a model to account for shot noise and bandwidth effects.
Abstract
Experiments on the direction-resolved full-counting statistics of single-electron tunneling allow testing the fundamentally important Fluctuation Theorem (FT). At the same time, the FT provides a frame for analyzing such data. Here we consider tunneling through a double quantum dot system which is coupled capacitively to a quantum point contact (QPC) detector. Fluctuations of the environment, including the shot noise of the QPC, lead to an enhancement of the effective temperature in the FT. We provide a quantitative explanation of this effect; in addition we discuss the influence of the finite detector bandwidth on the measurements.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMolecular Junctions and Nanostructures · Quantum and electron transport phenomena · Surface and Thin Film Phenomena
