Concept of spectrometer for resonant inelastic X-ray scattering with parallel detection in incoming and outgoing photon energies

TL;DR

This paper proposes a novel spectrometer design for resonant inelastic X-ray scattering that captures full 2D RIXS intensity maps in a single shot with high resolution, enabling advanced time-resolved experiments.

Contribution

The paper introduces a new spectrometer concept combining imaging and dispersion in orthogonal planes for parallel detection of incoming and outgoing photon energies in RIXS.

Findings

Achieves a resolving power above 11000 at 930 eV

Demonstrates potential for efficient time-resolved RIXS with XFELs

Shows promising simulation results for high-resolution 2D RIXS mapping

Abstract

A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver full two-dimensional map of RIXS intensity in one shot with parallel detection in incoming hvin and outgoing hvout photon energies. Preliminary ray-tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 in both hvin and hvout near a photon energy of 930 eV, with a vast potential for improvement. Combining such a spectrometer - nicknamed hv2 - with an XFEL source allows efficient time-resolved RIXS experiments.