Low-Temperature Resistivity Anomalies in Periodic Curved Surfaces

TL;DR

This paper theoretically investigates how periodic curvature in corrugated semiconductor films influences electrical resistivity, revealing that specific geometric parameters can significantly enhance resistivity due to curvature-induced potentials.

Contribution

It introduces a theoretical model showing the impact of surface curvature on resistivity and quantifies the parameters for experimental observation.

Findings

Resistivity increases at specific curvature parameters.

Curvature-induced potential significantly affects electron motion.

Quantification of geometric parameters for experimental detection.

Abstract

Effects of periodic curvature on the the electrical resistivity of corrugated semiconductor films are theoretically considered. The presence of a curvature-induced potential affects the motion of electrons confined to the thin curved film, resulting in a significant resistivity enhancement at specific values of two geometric parameters: the amplitude and period of the surface corrugation. The maximal values of the two parameters in order to observe the corrugation-induced resistivity enhancement in actual experiments are quantified by employing existing material constants.