Learning, complexity and information density
Joel Ratsaby

TL;DR
This paper empirically investigates how a learner's complexity, measured by information density, influences the randomness and structure of its mistakes, revealing a critical threshold that alters mistake sequence properties.
Contribution
It introduces the sysRatio as a novel measure of learner complexity and demonstrates its pivotal role in the randomness characteristics of mistake sequences.
Findings
A critical sysRatio threshold determines the randomness of mistakes.
Below the threshold, mistakes show low divergence from randomness.
Above the threshold, mistakes exhibit high divergence and complexity variance.
Abstract
What is the relationship between the complexity of a learner and the randomness of his mistakes? This question was posed in \cite{rat0903} who showed that the more complex the learner the higher the possibility that his mistakes deviate from a true random sequence. In the current paper we report on an empirical investigation of this problem. We investigate two characteristics of randomness, the stochastic and algorithmic complexity of the binary sequence of mistakes. A learner with a Markov model of order is trained on a finite binary sequence produced by a Markov source of order and is tested on a different random sequence. As a measure of learner's complexity we define a quantity called the \emph{sysRatio}, denoted by , which is the ratio between the compressed and uncompressed lengths of the binary string whose bit represents the maximum \emph{a posteriori}…
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Taxonomy
TopicsMachine Learning and Algorithms · Algorithms and Data Compression · Computability, Logic, AI Algorithms
