Level Crossing Rate and Average Fade Duration of the Double Nakagami-m Random Process and Application in MIMO Keyhole Fading Channels

TL;DR

This paper derives exact and approximate formulas for the level crossing rate and average fade duration of the double Nakagami-m process, applying these results to analyze MIMO keyhole fading channels with space-time coding.

Contribution

It provides the first exact expressions and accurate approximations for LCR and AFD of the double Nakagami-m process, and applies these to MIMO keyhole channel analysis.

Findings

Derived exact expressions for LCR and AFD.

Validated approximations with simulations.

Analyzed second order statistics of MIMO keyhole channels.

Abstract

We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are then used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.