Steplike intensity threshold behavior of extreme ionization in laser-driven Xe clusters
T. D\"oppner, J.P. M\"uller, A. Przystawik, S. G\"ode, J., Tiggesb\"aumker, K.-H. Meiwes-Broer, C. Varin, L. Ramunno, T. Brabec, and T., Fennel

TL;DR
This study observes a sharp intensity threshold for extreme ionization in laser-driven Xe clusters, revealing a rapid saturation of high charge states and elucidating the underlying mechanisms through molecular dynamics simulations.
Contribution
It uncovers a steplike intensity threshold behavior for ionization in Xe clusters and explains it with molecular dynamics analysis, a novel insight into laser-cluster interactions.
Findings
High charge Xe ions up to q=24 are produced at low threshold intensity.
Ion charge spectrum saturates quickly above threshold.
Molecular dynamics simulations match experimental results.
Abstract
The generation of highly charged Xe ions up to {} is observed in Xe clusters embedded in helium nanodroplets and exposed to intense femtosecond laser pulses (=800 nm). Laser intensity resolved measurements show that the high- ion generation starts at an unexpectedly low threshold intensity of about {10 W/cm}. Above threshold, the Xe ion charge spectrum saturates quickly and changes only weakly for higher laser intensities. Good agreement between these observations and a molecular dynamics analysis allows us to identify the mechanisms responsible for the highly charged ion production and the surprising intensity threshold behavior of the ionization process.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
