X-Ray Standing Waves at the Total Reflection Condition: Direct Method and Coherence Effects

TL;DR

This paper presents a method using total reflection X-ray standing waves to directly measure atomic density profiles and coherence effects in thin layers with high precision, especially for low-density structures.

Contribution

It introduces a Fourier inversion technique to obtain model-independent atomic density profiles from XSW-induced fluorescence modulation.

Findings

XSW intensity modulation is enhanced under total reflection conditions.

Fourier inversion yields direct atomic density profiles.

The method can analyze incident X-ray beam coherence.

Abstract

Fresnel theory is used to derive the complex electric-fields above and below an X-ray reflecting interface that separates two materials with differing indices of refraction. The interference between the incident and reflected waves produces an X-ray standing wave (XSW) above the reflecting interface. The XSW intensity modulation is strongly enhanced by the total external reflection (TR) condition, which occurs at incident angles less than the critical angle. At these small milliradian incident angles the XSW period (lambda/2theta) becomes very large, which makes the TR-XSW an ideal probe for studying low-density structures that extend 1 to 1000 nm above the reflecting interface. Fourier inversion of the XSW induced modulation in the X-ray fluorescence (XRF) yield from a specific atomic distribution within the overlayer directly produces a model-independent 1-D atomic density profile. The modulation can also be used to analyze the degree of coherence in the incident X-ray beam.