Electronic spin transport in graphene field effect transistors
M. Popinciuc, C. J\'ozsa, P. J. Zomer, N. Tombros, A. Veligura, H. T., Jonkman, and B. J. van Wees

TL;DR
This study investigates the causes of short spin relaxation times in graphene, finding that intrinsic mechanisms like Elliott-Yafet dominate, with minimal influence from extrinsic factors such as contacts or edges.
Contribution
It provides a comprehensive experimental analysis of spin relaxation in graphene, demonstrating that intrinsic mechanisms primarily determine relaxation times.
Findings
Spin relaxation times are 50-200 ps in graphene.
Spin relaxation is mainly of the Elliott-Yafet type.
Extrinsic factors like contacts have minimal impact.
Abstract
Spin transport experiments in graphene, a single layer of carbon atoms, indicate spin relaxation times that are significantly shorter than the theoretical predictions. We investigate experimentally whether these short spin relaxation times are due to extrinsic factors, such as spin relaxation caused by low impedance contacts, enhanced spin flip processes at the device edges or the presence of an aluminium oxide layer on top of graphene in some samples. Lateral spin valve devices using a field effect transistor geometry allowed for the investigation of the spin relaxation as a function of the charge density, going continuously from metallic hole to electron conduction (charge densities of cm) via the Dirac charge neutrality point (). The results are quantitatively described by a one dimensional spin diffusion model where the spin relaxation via the…
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