Electrode effects on electrical properties of polycrystalline (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 thin films

TL;DR

This study compares how different electrodes (IrO2 and Pt) affect the electrical properties of (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 thin films, revealing significant differences in dielectric behavior, tunability, and leakage currents.

Contribution

It provides a comparative analysis of electrode effects on dielectric properties and leakage currents in specific ferroelectric thin films.

Findings

Film on IrO2 shows stable dielectric constant up to 1 MHz.

IrO2 electrode results in lower leakage current.

Higher FOM observed with IrO2 electrode.

Abstract

(Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 thin films were grown on IrO2 and Pt coated Si substrates. Film on Pt electrode showed large dielectric dispersion at lower frequency and on other hand film on IrO2 showed dielectric constant almost independent with frequency up to 1 MHz. Tunability (Loss) on Pt and IrO2 at 1 MHz were 55% (0.159) and 45% (0.07), respectively. The FOM is also high for film on IrO2 (620) compared on to the Pt (345). Very low leakage current density also obtained on IrO2 (1.3 x 10-6 A/cm2) compared to Pt (6.14x10-3 A/cm2) coated Si substrates.