Atomic scale characterization of deformation induced interfacial mixing in a Cu/V nanocomposite wire

TL;DR

This study uses advanced microscopy techniques to analyze how cold drawing causes nanoscale interfacial mixing and filament fragmentation in a Cu/V nanocomposite wire, revealing deformation-induced atomic-level changes.

Contribution

It provides detailed atomic-scale characterization of deformation-induced interfacial mixing in a Cu/V nanocomposite wire, highlighting the effects of mechanical processing.

Findings

Nanoscale vanadium interfacial mixing observed

Formation of vanadium supersaturated solid solutions in copper

Filament fragmentation and dissolution due to deformation

Abstract

The microstructure of a Cu/V nanocomposite wire processed by cold drawing was investigated by high resolution transmission electron microscopy and atom probe tomography. The experimental data clearly reveal some deformation induced interfacial mixing where the vanadium filaments are nanoscaled. The mixed layer is a 2nm wide vanadium gradient in the fcc Cu phase. This mechanical mixing leads to the local fragmentation and dissolution of the filaments and to the formation of vanadium super saturated solid solutions in fcc Cu.