A tool to estimate the critical dynamics and thickness of superconducting films and interfaces

TL;DR

This paper presents a method to determine the critical dynamics, film thickness, and lateral length of superconducting films and interfaces by analyzing their magnetic field-dependent conductivity at the transition temperature.

Contribution

The authors introduce a novel analytical tool that uses magnetic field dependence of conductivity to extract key physical parameters of superconducting films and interfaces.

Findings

Successfully applied to amorphous Nb0.15 Si0.85 film data

Applied to LaAlO3/SrTiO3 interface data

Determined critical exponents and physical dimensions

Abstract

We demonstrate that the magnetic field dependence of the conductivity measured at the transition temperature allows the dynamical critical exponent, the thickness of thin superconducting films and interfaces, and the limiting lateral length to be determined. The resulting tool is applied to the conductivity data of an amorphous Nb0.15 Si0.85 film and a LaAlO3/SrTiO3 interface.