Integrated Circuit Readout for the Silicon Sensor Test Station

TL;DR

This paper describes a versatile integrated circuit readout system for silicon sensor testing, capable of measuring various sensor types and electrical parameters using CMOS-based chips and different sources.

Contribution

It introduces a set of CMOS-based analog chips and a self-trigger derandomizer for comprehensive silicon sensor testing across multiple applications.

Findings

Effective measurement of silicon sensors using the described readout system

Capability to study electrical parameters with laser or radioactive sources

Versatile testing setup for different sensor applications

Abstract

Various chips for the silicon sensors measurements are described. These chips are based on 0.35 um and 0.18um CMOS technology. Several analog chips together with self-trigger /derandomizer one allow to measure silicon sensors designed for different purposes. Tracking systems, calorimeters, particle charge measurement system and other application sensors can be investigated by the integrated circuit readout with laser or radioactive sources. Also electrical parameters of silicon sensors can be studied by such test setup.