Tsallis distribution and luminescence decays

TL;DR

This paper proposes using the Tsallis distribution as an alternative to the Kohlrausch function for fitting luminescence decay curves, demonstrating comparable accuracy and applicability to experimental and simulated data.

Contribution

The study introduces the Tsallis distribution as a novel fitting function for luminescence decays, offering an alternative to the traditional stretched exponential.

Findings

Tsallis distribution closely fits luminescence decay curves.

Effective in modeling porous silicon luminescence at low temperature.

Aligns well with trapping controlled luminescence simulations.

Abstract

Usually, the Kohlrausch (stretched exponential) function is employed to fit the luminescence decays. In this work we propose to use the Tsallis distribution as an alternative to describe them. We show that the curves of the luminescence decay obtained from the Tsallis distribution are close to those ones obtained from the stretched exponential. Further, we show that our result can fit well the data of porous silicon at low temperature and simulation result of the trapping controlled luminescence model.