Depth Resolution of Piezoresponse Force Microscopy
Florian Johann, Yongjun J. Ying, Tobias Jungk, Akos Hoffmann, Collin, L. Sones, Robert W. Eason, Sakellaris Mailis, and Elisabeth Soergel
TL;DR
This paper investigates the depth resolution of Piezoresponse Force Microscopy (PFM) by analyzing its response to ferroelectric domains of known depth, aiming to enable three-dimensional ferroelectric domain characterization.
Contribution
It introduces a method to determine PFM's depth resolution using known ferroelectric domain profiles, filling a gap in three-dimensional ferroelectric domain analysis.
Findings
PFM response varies with domain depth
Depth resolution of PFM quantified
Method enables 3D ferroelectric domain mapping
Abstract
Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.
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