Probabilistic model of fault detection in quantum circuits

TL;DR

This paper introduces a novel probabilistic approach for fault detection in quantum circuits, highlighting the limitations of classical testing methods and proposing a general methodology for identifying various quantum faults.

Contribution

It presents a new methodology for detecting functional faults in quantum circuits, accommodating probabilistic gates like Hadamard, and provides test vector generation techniques.

Findings

Classical test vectors fail for quantum circuits with probabilistic gates

The proposed method can generate test vectors for different quantum faults

Time complexity of the fault detection algorithm is analyzed

Abstract

It is shown that the fault testing for quantum circuits does not follow conventional classical techniques. If probabilistic gate like Hadamard gate is included in a circuit then the classical notion of test vector is shown to fail. We have reported several new and distinguishing features of quantum fault and also presented a general methodology for detection of functional faults in a quantum circuit. The technique can generate test vectors for detection of different kinds of fault. Specific examples are given and time complexity of the proposed quantum fault detection algorithm is reported.