X-ray fluorescence spectroscopy from ions at charged vapor/water interfaces

TL;DR

This study uses X-ray fluorescence spectroscopy to analyze ion accumulation at charged vapor/water interfaces, revealing enhanced signals due to surface charges and providing detailed ion density and absorption spectra.

Contribution

It demonstrates the ability to detect and quantify ion accumulation at interfaces using fluorescence spectroscopy, including for divalent ions, and compares absorption spectra with independent results.

Findings

Strong fluorescence signals observed below the critical angle with monolayer presence

Ion densities at the interface are quantitatively determined

Extended absorption spectra obtained and compared to recent data

Abstract

X-ray fluorescence spectra from monovalent ions (Cs+) that accumulate from dilute solutions to form an ion-rich layer near a charged Langmuir monolayer are presented. For the salt solution without the monolayer, the fluorescence signals below the critical angle are significantly lower than the detection sensitivity and only above the critical angle signals from the bulk are observed. In the presence of a monolayer that provides surface charges, strong fluorescence signals below the critical angle are observed. Ion density accumulated at the interface are determined from the fluorescence. The fluorescent spectra collected as a function of incident x-ray energy near the LIII edge yield the extended absorption spectra from the ions, and are compared to recent independent results. The fluorescence data from divalent Ba2+ with and without monolayer are also presented.