Topological Quantum Image Analysis

TL;DR

This paper introduces a novel method for visual image analysis using topological quantum properties, converting optical images into polarized light patterns to generate chiral edge currents in topological insulators.

Contribution

It proposes a new optical quantum information processing technique leveraging topological insulators and polarized squeezed light for image analysis.

Findings

Potential implementation with Bi or Bi-Sb thin films

Use of sub-micron holes for pattern realization

Link between optical patterns and topological edge currents

Abstract

A new approach to analyzing visual images is proposed, based on the idea of converting an optical image into a spatially varying pattern of polarized squeezed light, which is then used to produce a pattern of chiral edge currents in a thin film topological insulator. Thin films of Bi or Bi doped with Sb which are punctured with an array of sub-micron holes may be a way of realizing this kind of optical quantum information processing.