Quasi-Optical Characterization of Dielectric and Ferrite Materials
Philippe Goy (LKB - Lhomond), Sylvain Caroopen (LKB - Lhomond), Michel, Gross (LKB - Lhomond)
TL;DR
This paper discusses a compact quasi-optical method for characterizing dielectric and ferrite materials in the millimeter to submillimeter range, utilizing a specialized QO bench setup.
Contribution
It introduces a practical, compact quasi-optical approach for material characterization in high-frequency millimeter and submillimeter wave ranges.
Findings
Effective characterization of dielectric materials achieved.
Ferrite materials can be analyzed using the proposed setup.
The method offers a compact and efficient alternative to traditional techniques.
Abstract
Quasi-Optical Characterization of Dielectric and Ferrite Materials are made in the millimeter-submillimeter range by using a Quasi-Optical (QO) benches that can be relatively compact, typically of the order 10cm wide and 1m long.
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Taxonomy
TopicsPhotonic Crystals and Applications · Optical Polarization and Ellipsometry · Photonic and Optical Devices