Electrostically defined few-electron double quantum dot in silicon
W.H. Lim, H. Huebl, L.H. Willems van Beveren, S. Rubanov, P.G., Spizzirri, S.J. Angus, R.G. Clark, and A.S. Dzurak

TL;DR
This paper reports the fabrication and characterization of a silicon-based double quantum dot device with tunable inter-dot coupling, demonstrating clear resonant tunneling and energy spectrum control through low-temperature transport measurements.
Contribution
It introduces a MOS-compatible fabrication method for a tunable silicon double quantum dot with detailed spectroscopic analysis.
Findings
Tunable inter-dot coupling over a wide range.
Observation of resonant single-electron tunneling.
Clear charge stability diagram and energy spectrum control.
Abstract
A few-electron double quantum dot was fabricated using metal-oxide-semiconductor(MOS)-compatible technology and low-temperature transport measurements were performed to study the energy spectrum of the device. The double dot structure is electrically tunable, enabling the inter-dot coupling to be adjusted over a wide range, as observed in the charge stability diagram. Resonant single-electron tunneling through ground and excited states of the double dot was clearly observed in bias spectroscopy measurements.
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