Numerical study of The Remittances of Axially Excited Chiral Sculptured Zirconia Thin Films
Ferydon Babaei, Hadi Savaloni

TL;DR
This study uses coupled wave theory and experimental data to analyze the optical spectra of axially excited chiral zirconia thin films, highlighting dielectric dispersion effects and structural influences on Bragg peak shifts.
Contribution
It provides a numerical analysis of the optical properties of chiral zirconia thin films considering dielectric dispersion and compares theoretical results with experimental data.
Findings
Dielectric dispersion affects spectra at wavelengths shorter than the Bragg wavelength.
Bragg peak shifts to shorter wavelengths with increased void fraction.
Differences between theory and experiment are due to structural complexities and scattering in real films.
Abstract
The transmission and reflection spectra from a right-handed chiral sculptured zirconia thin film are calculated using the coupled wave theory and the Bruggeman homogenization formalism in conjunction with the experimental data for the relative dielectric constant of zirconia thin film. The dielectric dispersion function effect on these spectra appeared in wavelengths shorter than the Bragg wavelength. In wavelengths larger than the Bragg wavelength, the dispersion of the dielectric function can be ignored. The results achieved in this work are consistent with the experimental data (Wu et al. (2000)). A shift towards shorter wavelengths is observed for the Bragg peak with increasing the void fraction, which is in agreement with the theoretical work of Lakhtakia (2000). Sorge et al. (2006) also found this effect in their experimental results on TiO2 chiral thin films, while they also…
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